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Listar por autor "Léger, Gildas"
Mostrando ítems 1-13 de 13
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Artículo
A Procedure for Alternate Test Feature Design and Selection
Barragán Asián, Manuel José; Léger, Gildas (Institute of Electrical and Electronics Engineers, 2015)This paper is a practical illustration of the adoption of alternate tests based upon the judicious selection of the set ...
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Artículo
Alternate test of LNAs through ensemble learning of on-chip digital envelope signatures
Barragán-Villarejo, Manuel; Léger, Gildas; Rueda Rueda, Adoración; Huertas Díaz, José Luis (Springer, 2011-01-06)This paper presents a novel and low-cost methodology for testing embedded Low Noise Amplifiers (LNAs). It is based on the ...
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Ponencia
Boundary cost optimization for Alternate Test
Léger, Gildas (Institute of Electrical and Electronics Engineers, 2015)Alternate Test has demonstrated in the last decade that advanced machine-learning tools can leverage the accuracy gap ...
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Cascade ΣΔ modulator with digital correction for finite amplifier gain effects
Léger, Gildas; Rueda Rueda, Adoración (Institute of Electrical and Electronics Engineers, 2004)This paper presents a simple and fully digital solution to correct the effect of amplifier finite gain in cascade ΣΔ ...
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Artículo
Closed-loop Simulation Method for Evaluation of Static Offset in Discrete-Time Comparators
Ginés Arteaga, Antonio José; Peralías Macías, Eduardo; Léger, Gildas; Rueda Rueda, Adoración (Institute of Electrical and Electronics Engineers, 2014)This paper presents a simulation-based method for evaluating the static offset in discrete-time comparators. The proposed ...
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Digital test for the extraction of integrator leakage in first- and second-order ΣΔ modulators
Léger, Gildas; Rueda Rueda, Adoración (Institute of Electrical and Electronics Engineers, 2004)This paper proposes a digital technique to evaluate the integrator leakage within 1st and 2nd order ΣΔ modulators. Integrator ...
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Impact of random channel mismatch on the SNR and SFDR of time-interleaved ADCs
Léger, Gildas; Peralías Macías, Eduardo; Rueda Rueda, Adoración; Huertas Díaz, José Luis (Institute of Electrical and Electronics Engineers, 2004)Using several ADCs (Analog to Digital Converters) in parallel with convenient time offsets is considered as an efficient ...
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Low-cost digital detection of parametric faults in cascaded ΣΔ modulators
Léger, Gildas; Rueda Rueda, Adoración (Institute of Electrical and Electronics Engineers, 2009)The test of modulators is cumbersome due to the high performance they reach. Moreover, technology scaling trends raise ...
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Artículo
On chopper effects in discrete-time ΣΔ modulators
Léger, Gildas; Ginés Arteaga, Antonio José; Peralías Macías, Eduardo; Rueda Rueda, Adoración (Institute of Electrical and Electronics Engineers, 2010)Analog-to-digital converters based on ΣΔ modulators are used in a wide variety of applications. Due to their inherent ...
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Artículo
On-chip evaluation of oscillation-based-test output signals for switched-capacitor circuits
Vázquez García de la Vega, Diego; Huertas Sánchez, Gloria; Léger, Gildas; Peralías Macías, Eduardo; Rueda Rueda, Adoración; Huertas Díaz, José Luis (Springer, 2002)This work presents a simple and low-cost method for on-chip evaluation of test signals coming from the application of the ...
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Artículo
On-chip sinusoidal signal generation with harmonic cancelation for analog and mixed-signal BIST applications
Barragán Asián, Manuel José; Léger, Gildas; Vázquez García de la Vega, Diego; Rueda Rueda, Adoración (Springer, 2015)This work presents a technique for the on- chip generation of analog sinusoidal signals with high spectral quality and ...
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Ponencia
Random chopping in ΣΔ modulators
Léger, Gildas; Ginés Arteaga, Antonio José; Peralías Macías, Eduardo; Rueda Rueda, Adoración (2009)Σ∆ modulators make a clever use of oversampling and exhibit inherent monotonicity, high linearity and large dynamic range ...
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Ponencia
Regression modeling for digital test of ΣΔ modulators
Léger, Gildas; Rueda Rueda, Adoración (2010)The cost of Analogue and Mixed-Signal circuit testing is an important bottleneck in the industry, due to timeconsuming verification ...